The new edition of the OMICRON Magazine is out now! In the cover story we show you how you can use Digital Twins to carry out Iterative Closed-Loop tests on virtual IEDs. No physical test sets are required, and there are no limitations regarding the output power or number of test signals.
The Digital Twins can reveal errors in the design and logic in the early stages of development and make searching for them later in the process much faster. Why not use the time you save to read other fascinating articles in our magazine?
Check out the OMICRON Magazine, Issue 2 for more information.
Click here to view OMICRON Magazine, Issue 1
For more OMICRON News click here
Hi, Great new stuff !
Must read.