20th OMICRON South African User Conference 2021

Date & Time

8 - 10 November 2021

Venue

Kgotla Hall at the Indaba Hotel and Conference Centre, Fourways, Johannesburg

Virtual Platform: GoToWebinar

Conference

This years’ conference will be a hybrid event. Hence, participants can join us either physically at the venue, or virtually from their PC

  • This year we will add a one day tutorial to the usual two day conference.
  • The topic of the tutorial will be “Theory and Testing of Instrument Transformers”.
  • The conference will consist of presentations and hands-on practical sessions.
  • Pre-requisite for physical attendance is that participants are either fully vaccinated, recovered within the last six months, or tested on-site against Covid-19.
  • The event will be CPD accredited.
  • Call for Registration will be sent out in due course.

Objective

Experiences in the field of routine maintenance, commissioning and testing of primary / HV plant (circuit breakers, current transformers, voltage transformers, power transformers, rotating machines, HV cables and HV lines) as well as secondary equipment (protection relays and measurement devices) will be presented. The conference will provide an information and discussion forum for test technicians and engineers. Although the event is aimed at the regular users of OMICRON test equipment, new and prospective users will also benefit.

Target Audience

Engineers and technicians from electrical utilities, industrial plants, equipment manufacturers and service companies involved in the commissioning, routine maintenance and diagnostic testing of primary / HV plant as well as secondary equipment (protective relays & measurement devices). The conference will be registered for ECSA Continued Professional Development (CPD) points.

Speakers

Users with a utility background as well as local and international product specialists from OMICRON will deliver presentations and facilitate discussions.

Call for Papers

If you have an interesting case study, experience or application which could be of interest to the wider testing fraternity, we encourage you to present this at our conference. Kindly contact us if you would like us to assist you with the preparation and presentation of such a contribution.